Acterna 8000 Overview

• Datacomm interfaces in one testmodule for ANSI and ETSI standards
• Native datacomm interfaces for EIA-530, RS-449 (422 and 423), RS-232, X.21, V.35, and V.36 serial interfaces
• Government standards support for MIL-188C and MIL-188-114
• Interface module slot for conditioned diphase and expandability to new technologies
• Synchronous/Asynchronous and DTE/DCEmodes of operation
• A full suite of BER patternswith data-rate support up to 18 Mbps
• ‘Virtual breakout box’ functionality allowing complete flow-control troubleshooting, with user-controllable signaling leads (CTS, RTS, DTR, RLSD, and DSR)
• Native test connectors for 15-, 25-, and 37-pin datacomm interfaces mean no need for custom adapter cables
• BER test patterns :Mark (All Ones), Space (All Zeros), 1:1, 63, 511, 2047, 2047R (Reverse), 2047RI (Reversed and Inverted), 2^15-1, 2^20-1, 2^23-1, QRSS, Programmable (1,2,3), QBF1 (FOX), QBF (2,3), Long User (1,2,3), Delay, All Zeros, 1:3, 1:4, 1:7, 3:1, 7:1 *Note: Both ANSI and ITU variations of these patterns are supported

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