For example: Agilent E4440A or Anritsu 68369
JEOL JSM-6701F Ultra High Resolution FE SEM Microscope w/ Oxford X-Max 80 SDD Detector

Model:JSM-6701F

Manufactured by: JEOL

Category:Microscope

JEOL JSM-6701F  - Microscope

JEOL JSM-6701F Overview

  • High resolution: 1 nm (15 kV), 2.2 nm (1 kV)
  • High resolution even at large probe current for analysis
  • Completely automated electron optics
  • Maximum 2 nA probe current without changing objective lens aperture size
  • Specimen chamber for up to 200 mm diameter specimen
  • High stability large eucentric specimen stage with motorized control
  • Large specimen exchange air lock chamber
  • One action specimen exchange mechanism
  • Large LCD display with 1,280  1,024 pixel resolution
  • Compatible with network

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