For example: Agilent E4440A or Anritsu 68369
- Test and measurement equipment
- Signal Source
- Keithley Instruments
- Keithley Instruments 2520
Keithley 2520 Pulsed Laser Diode Test System w/ Remote Test Head
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Keithley Instruments 2520 Overview
Features
- Simplifies laser diode LIV testing prior to packaging or active temperature control
- Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
- Sweep can be programmed to stop on optical power limit
- Combines high accuracy source and measure capabilities for pulsed and DC testing
- Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
- Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
- Pulse capability up to 5A, DC capability up to 1A
- 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
- Measurement algorithm increases the pulse measurement's signal-to-noise ratio
- Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
- Digital I/O binning and handling operations
- IEEE-488 and RS-232 interfaces