For example: Agilent E4440A or Anritsu 68369
- Test and measurement equipment
- Data Generator
- Stanford Research Systems
- Stanford Research Systems SR200
Data Generator
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Stanford Research Systems SR200 Overview
The Stanford Research SR200 Gate Scanner module is designed to automate waveform recovery with the SR250 and SR255 Gated Integrator modules. Waveform recovery is done by slowly scanning the gate of the integrator ver the waveform of interest. Both the SR250 and SR255 modules have external gate delay control inputs. The SR200 provides an adjustable ramp voltage needed to scan the gates using these inputs. The initial and final delays, as well as the scan time, are fully adjustable. Single or repeated scans may be performed in the forward or reverse direction over any portion of the waveform. Scan times from 10 milliseconds to 5 minutes may be selected. In addition to the delay control output, the SR200 has a 0 to 10 volt X-axis ramp output designed to drive the X-axis of a chart recorder or an oscilloscope.