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Tektronix RSA3303A Overview
Define issues and solve problems faster by characterizing your device, system or signal more completely and rapidly than previously possible with swept spectrum analyzers. Tektronix RSA3300A Series Real-Time Spectrum Analyzers capture many signals not viewable on swept spectrum analyzers by seamlessly capturing and storing a span of RF frequencies all at one time*1. Once a signal is captured it can be viewed simultaneously and analyzed in time-correlated frequency, time and modulation domains. RSA Series instruments include not only Real-Time Spectrum Analyzer fast-signal capture, internal memory and modulation analysis but also functionality and operation of a swept spectrum analyzer for looking at very wide spans, all in an integrated, transportable package.
Features:
- Real-Time Spectrum Analysis Provides Seamless Capture of Time-varying, Transient or Periodic RF Signals not Possible with Swept Spectrum Analyzers
- Up to 65.536 Ms (256MB) of Internal Memory Provides for Complete Analysis of Signals Over Time Without Making Multiple Measurements
- Time-correlated, Simultaneous Views of Time, Frequency, and Modulation Domains Provide Greater and Unique Understanding of Signal Behavior
- Spectrogram Provides a Revealing Picture of RF Signal Frequency and Amplitude Behavior Over Time – Not Possible with a Swept Spectrum Analyzer
- Frequency Mask Trigger – Available only from Tektronix – Makes it Easy to Capture Fast, Transient, or Intermittent Signals that Swept Spectrum Analyzers Would Miss
- Spectrum Analyzer Mode for Very Wide Span Analyses
- Built-in Demodulators Enhance Analysis of AM, ASK, FM, FSK, and PM Signals
- Digital Demodulator Offers Affordable Vector Signal Analysis
- Outstanding DC – 20 MHz Dynamic Range and Low Phase Noise Mean You Can Make High-Performance Weak Signal and Phase Noise Measurements
- Analog and Digital Modulation Signal Quality Analysis
- Understanding Frequency and Spectral Occupancy Behavior Over Time
- Capture and Characterization of Undesired, Unknown, or Interfering Signals
- Device/system Design or Operational Diagnostic Measurement
- Getting Answers to Elusive EMI Problems
- VCO/synthesizer Design, RFID Device Characterization, General Purpose Digital Modulation Vector Signal Analysis, Spectrum Monitoring, Radar Measurements