Teseq (Schaffner) NSG 5003 Overview

Fast transient interference signals injected onto a vehicle's wiring harness through switching of associated peripheral devices can affect the correct functioning of adjacent electronic units. In conformance with the standards (ISO/SAE pulse 3a/3b), the NSG 5003 simulates these interference phenomena by means of pulse bursts. The vibrant development of electronic devices for the automotive industry means that better and faster test methods are required. The burst generator more than meets these increasing demands; its technical properties exceeding the specifications laid down in the standards by several factors. Higher pulse voltages, burst frequencies and pulse burst specifications are just part of it; there are also automated functions for weak spot analyses and long-term trials.

The EUT connection, as well as the separate connector for the coupling clamp used in data line tests, has been optimized to suit the high frequency conditions prevailing in such a fast pulse environment.

Pulse amplitude	Impedance	Pulse rise time	Burst frequency	Pulses per burst	Burst repetition	Pulse modes	Pulse duration
20 to 800V in 1V steps	50O	5ns	1 to 100kHz in 0.1kHz steps	1 - 200	90ms to 99.9 seconds in 10ms steps	Single, continuous, programmed 1 to 99999	100ns (into 50O)

Teseq (Schaffner) NSG 5003 All Available Options

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